5. Modélisation C

5.1. Caractéristiques de la modélisation : d-plan (QUAD9)

Conditions limites:

côté \(\mathrm{AB}\)	DDL_IMPO = ( GROUP_NO = bordAB DY = 0. )
côté \(\mathrm{EF}\)	FACE_IMPO = ( GROUP_MA = faceEF DNOR = 0. )
pression sur \(\mathrm{AE}\)	PRES_REP = ( GROUP_MA = faceAE PRES = 60. )

Noms des nœuds:	\(A=\mathrm{N1}\)	\(B=\mathrm{N47}\)	\(C=\mathrm{N351}\)
	\(D=\mathrm{N374}\)	\(E=\mathrm{N569}\)	\(F=\mathrm{N423}\)

5.2. Caractéristiques du maillage

Nombre de nœuds: 725

Nombre de mailles et types: 168 QUAD9

5.3. Grandeurs testées et résultats

Localisation	Grandeur	V aleur de r éférence	Type de référence	Tolérance
point \(A\)
	Champ DEPL, comp. \(X\)	5.7210-5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)		“ANALYTIQUE”	1E-10 (absolu)
Maille M1	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)	–60.	“ANALYTIQUE”	1%
Maille M1	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	1%
Maille M1	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	5%
Maille M1	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)		“ANALYTIQUE”	1E-2(absolu)
\(B\)
	Champ DEPL, comp. \(X\)	3.6410-5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)		“ANALYTIQUE”	1E-10 (absolu)
Maille M12	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)		“ANALYTIQUE”	0,1(absolu)
Maille M12	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	1%
Maille M12	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	1%
Maille M12	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)		“ANALYTIQUE”	1E-2(absolu)
\(C\)
	Champ DEPL, comp. \(X\)	5.2845910–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	2.1889510–5	“ANALYTIQUE”	1%
Maille M73	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)	-36.56854	“ANALYTIQUE”	2%
Maille M85	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)	-36.56854	“ANALYTIQUE”	2%
Maille M73	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)	76.56854	“ANALYTIQUE”	1%
Maille M85	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)	76.56854	“ANALYTIQUE”	1%
Maille M73	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	3%
Maille M85	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	3%
Maille M73	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)	-56.56854	“ANALYTIQUE”	1%
Maille M85	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)	-56.56854	“ANALYTIQUE”	1%
\(D\)
	Champ DEPL, comp. \(X\)	3.3629210–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	1.3929710–5	“ANALYTIQUE”	1%
Maille M84	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)	5.85786	“ANALYTIQUE”	2%
Maille M96	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)	5.85786	“ANALYTIQUE”	2%
Maille M84	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)	34.14214	“ANALYTIQUE”	1%
Maille M96	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)	34.14214	“ANALYTIQUE”	1%
Maille M84	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	1%
Maille M96	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	1%
Maille M84	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)	-14.14213	“ANALYTIQUE”	1%
Maille M96	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)	-14.14213	“ANALYTIQUE”	1%
\(E\)
	Champ DEPL, comp. \(X\)	4.0446510–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	4.0446510–5	“ANALYTIQUE”	1%
Maille M136	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)		“ANALYTIQUE”	3%
Maille M136	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	3%
Maille M136	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	3%
Maille M136	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)	-80.	“ANALYTIQUE”	1%
\(F\)			“ANALYTIQUE”
	Champ DEPL, comp. \(X\)	2.5738710–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	2.5738710–5	“ANALYTIQUE”	1%
Maille M102	Champ SIGM_ELNO, comp. \(\mathit{SIXX}\)		“ANALYTIQUE”	1%
Maille M102	Champ SIGM_ELNO, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	1%
Maille M102	Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	1%
Maille M102	Champ SIGM_ELNO, comp. \(\mathit{SIXY}\)	-20.	“ANALYTIQUE”	1%

5.4. Remarques

L’évolution de l’erreur induite par le maillage suivant \(\mathrm{AB}\) , \(\mathrm{CD}\) ou \(\mathrm{EF}\) , est nettement atténuée par rapport à la modélisation A.