3. Modélisation A

3.1. Caractéristiques de la modélisation : d-plan (QUAD4 + TRIA3)

Conditions limites:
côté \(\mathrm{AB}\)	DDL_IMPO = ( GROUP_NO = bordAB DY = 0. )
côté \(\mathrm{EF}\)	FACE_IMPO = ( GROUP_MA = faceEF DNOR = 0. )
pression sur la face \(\mathrm{AE}\)	PRES_REP = ( GROUP_MA = faceAE PRES = 60. )

Noms des nœuds:	\(A=\mathrm{N23}\)	\(B=\mathrm{N1}\)	\(C=\mathrm{N391}\)
	\(D=\mathrm{N369}\)	\(E=\mathrm{N451}\)	\(F=751\)

3.2. Caractéristiques du maillage

Nombre de nœuds: 759

Nombre de mailles et types: 704 TRIA3, 352 QUAD4

3.3. Grandeurs testées et résultats

Localisation	Grandeur	V aleur de r éférence	Type de référence	Tolérance
point \(A\)
	Champ DEPL, comp. \(X\)	5.7210-5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)		“ANALYTIQUE”	1E-10 (absolu)
	Champ SIGM_NOEU, comp. \(\mathit{SIXX}\)	–60.	“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIXY}\)		“ANALYTIQUE”	2 (absolu)
\(B\)
	Champ DEPL, comp. \(X\)	3.6410-5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)		“ANALYTIQUE”	1E-10 (absolu)
	Champ SIGM_NOEU, comp. \(\mathit{SIXX}\)		“ANALYTIQUE”	2 (absolu)
	Champ SIGM_NOEU, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	8%
	Champ SIGM_NOEU, comp. \(\mathit{SIXY}\)		“ANALYTIQUE”	1 (absolu)
\(C\)
	Champ DEPL, comp. \(X\)	5.2845910–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	2.1889510–5	“ANALYTIQUE”	1%
	Champ SIGM_NOEU, comp. \(\mathit{SIXX}\)	-36.56854	“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIYY}\)	76.56854	“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIXY}\)	-56.56854	“ANALYTIQUE”	5%
\(D\)
	Champ DEPL, comp. \(X\)	3.3629210–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	1.3929710–5	“ANALYTIQUE”	1%
	Champ SIGM_NOEU, comp. \(\mathit{SIXX}\)	5.85786	“ANALYTIQUE”	20%
	Champ SIGM_NOEU, comp. \(\mathit{SIYY}\)	34.14214	“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	1%
	Champ SIGM_NOEU, comp. \(\mathit{SIXY}\)	-14.14213	“ANALYTIQUE”	8%
\(E\)
	Champ DEPL, comp. \(X\)	4.0446510–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	4.0446510–5	“ANALYTIQUE”	1%
	Champ SIGM_NOEU, comp. \(\mathit{SIXX}\)		“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	6%
	Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	1%
	Champ SIGM_NOEU, comp. \(\mathit{SIXY}\)	-80.	“ANALYTIQUE”	5%
\(F\)			“ANALYTIQUE”
	Champ DEPL, comp. \(X\)	2.5738710–5	“ANALYTIQUE”	1%
	Champ DEPL, comp. \(Y\)	2.5738710–5	“ANALYTIQUE”	1%
	Champ SIGM_NOEU, comp. \(\mathit{SIXX}\)		“ANALYTIQUE”	7%
	Champ SIGM_NOEU, comp. \(\mathit{SIYY}\)		“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\)		“ANALYTIQUE”	5%
	Champ SIGM_NOEU, comp. \(\mathit{SIXY}\)	-20.	“ANALYTIQUE”	5%

3.4. Remarques

L’augmentation de l’erreur, quand on passe de \(\mathrm{AB}\) à \(\mathrm{CD}\) puis \(\mathrm{EF}\) , est imputable au maillage (densité en éléments QUAD4 inférieure à celle en TRIA3).