4. Modélisation B#
4.1. Caractéristiques de la modélisation : d-plan (QUAD8 + TRIA6)#
Conditions limites:
côté \(\mathrm{AB}\) |
DDL_IMPO = ( GROUP_NO = bordAB DY = 0. ) |
côté \(\mathrm{EF}\) |
FACE_IMPO = ( GROUP_MA = faceEF DNOR = 0. ) |
pression sur \(\mathrm{AE}\) |
PRES_REP = ( GROUP_MA = faceAE PRES = 60. ) |
Noms des nœuds: |
\(A=\mathrm{N2}\) |
\(B=\mathrm{N48}\) |
\(C=\mathrm{N401}\) |
\(D=\mathrm{N424}\) |
\(E=\mathrm{N606}\) |
\(F=\mathrm{N494}\) |
4.2. Caractéristiques du maillage#
Nombre de nœuds: 729
Nombre de mailles et types: 192 TRIA6, 96 QUAD8
4.3. Grandeurs testées et résultats#
Localisation |
Grandeur |
V aleur de r éférence |
Type de référence |
Tolérance |
point \(A\) |
||||
Champ DEPL, comp. \(Y\) |
5.7210-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
“ANALYTIQUE” |
1E-10 (absolu) |
||
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-60. |
“ANALYTIQUE” |
1% |
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-60. |
“ANALYTIQUE” |
1% |
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
2% |
|
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
2% |
|
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
\(B\) |
||||
Champ DEPL, comp. \(Y\) |
3.6410-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
“ANALYTIQUE” |
1E-10(absolu) |
||
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
0,5 (absolu) |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
0,5 (absolu) |
|
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
\(C\) |
||||
Champ DEPL, comp. \(Y\) |
5.2845910–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
2.1889510–5 |
“ANALYTIQUE” |
1% |
|
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
56.56854 |
“ANALYTIQUE” |
1% |
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
56.56854 |
“ANALYTIQUE” |
1% |
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
56.56854 |
“ANALYTIQUE” |
1% |
\(D\) |
||||
Champ DEPL, comp. \(Y\) |
3.3629210–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
1.3929710–5 |
“ANALYTIQUE” |
1% |
|
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
5.85786 |
“ANALYTIQUE” |
5% |
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
5.85786 |
“ANALYTIQUE” |
5% |
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
5.85786 |
“ANALYTIQUE” |
5% |
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
14.14213 |
“ANALYTIQUE” |
1% |
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
14.14213 |
“ANALYTIQUE” |
1% |
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
14.14213 |
“ANALYTIQUE” |
1% |
\(E\) |
||||
Champ DEPL, comp. \(Y\) |
4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
-4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
5% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
5% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
1% |
|
\(F\) |
“ANALYTIQUE” |
|||
Champ DEPL, comp. \(Y\) |
2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
-2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
1% |
4.4. Remarques#
L’évolution de l’erreur induite par le maillage suivant \(\mathrm{AB}\) , \(\mathrm{CD}\) ou \(\mathrm{EF}\) , est nettement atténuée par rapport à la modélisation A.